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本文报道了一种测定材料逸出功的新方法,二次电子发射-接触电位差法(简称SEE-CPD法)。用该法对Ni,Al,Au和Mo四种纯金属的逸出功进行了测量,并与Fowler等温法和Kelvin的接触电位差法比较,结果是一致的。表明SEE-CPD法在理论上是正确的,在实际应用中也是成功的。This paper reports a new method of measuring the work function of meterials. The method is based on accurate measuring of energy distribution of secondary electrons and contact potential difference of meterials. We call it the method of secondary electron emission-contact potential difference (SEE-CPD method). The work function of pure metals of Ni, Al, Au and Mo were measured by this method. The results are well consistent with that obtained by using photo-electron and Kelvin's method. The fundamentals and applications of the SEE-CPD method are proved to be correct and reliable.
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