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Back-gate bias effect on partially depleted SOI/MOS back-gate performances under radiation condition

Zhou Xin-Jie Li Lei-Lei Zhou Yi Luo Jing Yu Zong-Guang

Citation:

Back-gate bias effect on partially depleted SOI/MOS back-gate performances under radiation condition

Zhou Xin-Jie, Li Lei-Lei, Zhou Yi, Luo Jing, Yu Zong-Guang
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(PLEASE TRANSLATE TO ENGLISH

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  • Abstract views:  6831
  • PDF Downloads:  543
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Publishing process
  • Received Date:  07 December 2011
  • Accepted Date:  05 April 2012
  • Published Online:  05 October 2012

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