Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Dielectric property of binary phase composite and its interface investigated by electric force microscope

Sun Zhi Wang Xuan Han Bai Song Wei Zhang Dong Guo Xiang-Yu Lei Qing-Quan

Citation:

Dielectric property of binary phase composite and its interface investigated by electric force microscope

Sun Zhi, Wang Xuan, Han Bai, Song Wei, Zhang Dong, Guo Xiang-Yu, Lei Qing-Quan
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

  • Dielectric property of two-phase stack-up sample is studied by electric force microscopy (EFM). Highly oriented pyrolytic graphite (HOPG)/polyethylene(PE) and mica/PE are fabricated. The phenomenon that phase shift (Δθ) of conducting probe varys with dielectric constant of material is discovered near the interface between the two materials by using phase detection EFM. The characteristic curves of tan(Δθ) versus tip voltage VEFM are of parabolic type. Quadratic coefficient increases with dielectric constant ε increasing. An approach to the qualitative analysis of the dielectric property near the interface between different material at the micro/nanometer scale, is provided in this paper.
    • Funds: Project supported by the National Basic Research Program of China (Grant No. 2009CB724505), the National Natural Science Foundation of China (Grant No. 5097702), State Key Laboratory Breeding Base of Dielectrics Engineering, China (Grant No. DE2012B07) and Harbin University of Science and Technology Science Foundation for Youths, China (Grant No. 2011YF013).
    [1]

    Kao K C, Hwang W 1981 Electrical Transport in Solid (Oxford: Pergamon Press) p168

    [2]

    Zhang P H, Fan Y, Wang F C, Xie H, Li G, Lei Q Q 2005 Chin. Phys. Lett. 22 1253

    [3]

    Li S T, Cheng P F, Zhao L, Li J Y 2012 Acta. Phys. Sin. 58 523 (in Chinese) [李盛涛, 成鹏飞, 赵雷, 李建英 2009 物理学报 58 523]

    [4]

    Cheng P F, Li S T, Li J Y 2012 Acta. Phys. Sin. 61 187302 (in Chinese) [成鹏飞, 李盛涛, 李建英 2012 物理学报 61 187302]

    [5]

    Holger S, Julius G V 2010 Scanning Force Microscopy of Polymers (Deutschland: Springer Press) p10

    [6]

    Lei Q Q, Fan Y, Wang X 2006 Trans China Electrotechnical Soc 21 1 (in Chinese) [雷清泉, 范勇, 王暄 2006 电工技术学报 21 1]

    [7]

    Belaidi S, Girard P, Leveque G 1997 J. Appl. Phys. 81 1023

    [8]

    Yves M, David W A, Kumar H W 1988 Appl. Phys. Lett. 52 1103

    [9]

    Paula M V, Yossi R, Angus K 2005 Scanning Probe Microscopy: Characterization, Nanofabrication, and Device Application of Functional Materials (Netherlands: Kluwer Academic Publishers) p289

    [10]

    Jones J T, Bridger P M, Marsh O J, McGill T C 1999 Appl. Phys. Lett. 75 1326

    [11]

    Marchi F, Dianoux R, Smilde H J H, Mur P, Comin F, Chevrier J 2008 J. Electrostat. 66 538

    [12]

    Zhu Y F, Xu C H, Wang B, Woo C H 2005 Comp. Mater. Sci. 33 53

    [13]

    Jeandupeux O, Marsico V, Acovic A, Fazan P, Brune H 2002 Microelectron Reliab. 42 225

    [14]

    Okur S, Yakuphanoglu F 2009 Sensor Actuat A Phys. 149 241

    [15]

    Benstetter G, Biberger R, Liu D P 2009 Thin Solid Films 517 5100

    [16]

    Doukkali A, Ledain S, Guasch C, Bonnet J 2004 Appl. Sur. Sci. 235 507

    [17]

    Albrecht V, Janke A, Drechsler, Schubert G, Németh E, Simon F 2006 Progr Colloid Polym. Sci. 132 48

    [18]

    Riedel C, Arinero R, Tordjeman P 2009 J. Appl. Phys. 106 024315

    [19]

    Riedel C, Schwartz G A, Arinero R 2010 Ultramicroscopy 110 634

    [20]

    Krayev A V, Talroze R V 2004 Polymer 45 8195

    [21]

    Krayev A V, Shandryuk G A, Grigorov L N, Talroze R V 2006 Macromol. Chem. Phys. 207 966

    [22]

    Lewis T J 1994 IEEE Tran. Dielect. El. In. 1 812

    [23]

    Lewis T J. 2004 IEEE Tran. Dielect. El. In. 11 739

    [24]

    Tanaka T, Kozako M, Fuse M, Ohki Y 2004 IEEE Tran. Dielect. El. In. 12 669

    [25]

    Zhao H B, Han L 2008 Nanotechnology & Precision Engineering 6 89 (in Chinese) [赵慧斌, 韩立 2008 纳米技术与精密工程 6 89]

    [26]

    Qi G C, Yang Y L, Yan H, Guan L, Li Y B, Qiu X H, Wang C 2009 J. Phys. Chem. C 113 204

    [27]

    Qi G C, Yan H, Guan L, Yang Y L, Qiu X H, Wang C, Li Y B, Jiang Y P 2008 J. Appl. Phys. 103 114311

    [28]

    Zhang D D, Wang R, Jiang Y P, Qi G C, Wang C, Qiu X H 2011 Physics 40 573 (in Chinese) [张冬冬, 王锐, 蒋烨平, 戚桂村, 王琛, 裘晓辉 2011 物理 40 573]

    [29]

    Piarristeguy A A, Ramonda M, Pradel A 2010 J. Non-Cryst. Solids. 356 2402

    [30]

    Mesa G, Dobado Fuentes E, Sáenz J J 1996 J. Appl. Phys. 79 39

    [31]

    Kazuya G, Kazuhiro H 1998 J. Appl. Phys. 84 4043

  • [1]

    Kao K C, Hwang W 1981 Electrical Transport in Solid (Oxford: Pergamon Press) p168

    [2]

    Zhang P H, Fan Y, Wang F C, Xie H, Li G, Lei Q Q 2005 Chin. Phys. Lett. 22 1253

    [3]

    Li S T, Cheng P F, Zhao L, Li J Y 2012 Acta. Phys. Sin. 58 523 (in Chinese) [李盛涛, 成鹏飞, 赵雷, 李建英 2009 物理学报 58 523]

    [4]

    Cheng P F, Li S T, Li J Y 2012 Acta. Phys. Sin. 61 187302 (in Chinese) [成鹏飞, 李盛涛, 李建英 2012 物理学报 61 187302]

    [5]

    Holger S, Julius G V 2010 Scanning Force Microscopy of Polymers (Deutschland: Springer Press) p10

    [6]

    Lei Q Q, Fan Y, Wang X 2006 Trans China Electrotechnical Soc 21 1 (in Chinese) [雷清泉, 范勇, 王暄 2006 电工技术学报 21 1]

    [7]

    Belaidi S, Girard P, Leveque G 1997 J. Appl. Phys. 81 1023

    [8]

    Yves M, David W A, Kumar H W 1988 Appl. Phys. Lett. 52 1103

    [9]

    Paula M V, Yossi R, Angus K 2005 Scanning Probe Microscopy: Characterization, Nanofabrication, and Device Application of Functional Materials (Netherlands: Kluwer Academic Publishers) p289

    [10]

    Jones J T, Bridger P M, Marsh O J, McGill T C 1999 Appl. Phys. Lett. 75 1326

    [11]

    Marchi F, Dianoux R, Smilde H J H, Mur P, Comin F, Chevrier J 2008 J. Electrostat. 66 538

    [12]

    Zhu Y F, Xu C H, Wang B, Woo C H 2005 Comp. Mater. Sci. 33 53

    [13]

    Jeandupeux O, Marsico V, Acovic A, Fazan P, Brune H 2002 Microelectron Reliab. 42 225

    [14]

    Okur S, Yakuphanoglu F 2009 Sensor Actuat A Phys. 149 241

    [15]

    Benstetter G, Biberger R, Liu D P 2009 Thin Solid Films 517 5100

    [16]

    Doukkali A, Ledain S, Guasch C, Bonnet J 2004 Appl. Sur. Sci. 235 507

    [17]

    Albrecht V, Janke A, Drechsler, Schubert G, Németh E, Simon F 2006 Progr Colloid Polym. Sci. 132 48

    [18]

    Riedel C, Arinero R, Tordjeman P 2009 J. Appl. Phys. 106 024315

    [19]

    Riedel C, Schwartz G A, Arinero R 2010 Ultramicroscopy 110 634

    [20]

    Krayev A V, Talroze R V 2004 Polymer 45 8195

    [21]

    Krayev A V, Shandryuk G A, Grigorov L N, Talroze R V 2006 Macromol. Chem. Phys. 207 966

    [22]

    Lewis T J 1994 IEEE Tran. Dielect. El. In. 1 812

    [23]

    Lewis T J. 2004 IEEE Tran. Dielect. El. In. 11 739

    [24]

    Tanaka T, Kozako M, Fuse M, Ohki Y 2004 IEEE Tran. Dielect. El. In. 12 669

    [25]

    Zhao H B, Han L 2008 Nanotechnology & Precision Engineering 6 89 (in Chinese) [赵慧斌, 韩立 2008 纳米技术与精密工程 6 89]

    [26]

    Qi G C, Yang Y L, Yan H, Guan L, Li Y B, Qiu X H, Wang C 2009 J. Phys. Chem. C 113 204

    [27]

    Qi G C, Yan H, Guan L, Yang Y L, Qiu X H, Wang C, Li Y B, Jiang Y P 2008 J. Appl. Phys. 103 114311

    [28]

    Zhang D D, Wang R, Jiang Y P, Qi G C, Wang C, Qiu X H 2011 Physics 40 573 (in Chinese) [张冬冬, 王锐, 蒋烨平, 戚桂村, 王琛, 裘晓辉 2011 物理 40 573]

    [29]

    Piarristeguy A A, Ramonda M, Pradel A 2010 J. Non-Cryst. Solids. 356 2402

    [30]

    Mesa G, Dobado Fuentes E, Sáenz J J 1996 J. Appl. Phys. 79 39

    [31]

    Kazuya G, Kazuhiro H 1998 J. Appl. Phys. 84 4043

  • [1] Meng Jing-Yi, Lu Hong-Wei, Ma Shi-Le, Zhang Jia-Qi, He Fu-Min, Su Wei-Tao, Zhao Xiao-Dong, Tian Ting, Wang Yi, Xing Yu. Progress of application of functional atomic force microscopy in study of nanodielectric material properties. Acta Physica Sinica, 2022, 71(24): 240701. doi: 10.7498/aps.71.20221462
    [2] You Yi-Wei, Cui Jian-Wen, Zhang Xiao-Feng, Zheng Feng, Wu Shun-Qing, Zhu Zi-Zhong. Properties of lithium phosphorus oxynitride (LiPON) solid electrolyte - Li anode interfaces. Acta Physica Sinica, 2021, 70(13): 136801. doi: 10.7498/aps.70.20202214
    [3] Zhang Xian-Fei, Wang Ling-Ling, Zhu Hai, Zeng Cheng. Numerical study on salt finger at interface between fluid layer and porous layer by single-domain approach. Acta Physica Sinica, 2020, 69(21): 214701. doi: 10.7498/aps.69.20200351
    [4] Liu Si-Mian, Han Wei-Zhong. Mechanism of interaction between interface and radiation defects in metal. Acta Physica Sinica, 2019, 68(13): 137901. doi: 10.7498/aps.68.20190128
    [5] Liu Bo-Fei, Bai Li-Sha, Zhang De-Kun, Wei Chang-Chun, Sun Jian, Hou Guo-Fu, Zhao Ying, Zhang Xiao-Dan. Effect of a-Si:H interface buffer layer on the performance of hydrogenated amorphous silicon germanium thin film solar cell. Acta Physica Sinica, 2013, 62(24): 248801. doi: 10.7498/aps.62.248801
    [6] Yang Jin, Zhou Mao-Xiu, Xu Tai-Long, Dai Yue-Hua, Wang Jia-Yu, Luo Jing, Xu Hui-Fang, Jiang Xian-Wei, Chen Jun-Ning. Composite interfaces and electrode properties of resistive random access memory devices. Acta Physica Sinica, 2013, 62(24): 248501. doi: 10.7498/aps.62.248501
    [7] Wang Fei, Liu Wang, Deng Ai-Hong, Zhu Jing-Jun, An Zhu, Wang Yuan. Interface effects on helium retention properties of ZrN/TaN nano-multilayers. Acta Physica Sinica, 2013, 62(18): 186801. doi: 10.7498/aps.62.186801
    [8] Wang Jun-Guo, Liu Fu-Sheng, Li Yong-Hong, Zhang Ming-Jian, Zhang Ning-Chao, Xue Xue-Dong. The structural transition of water at quartz/water interfaces under shock compression in phase region of liquid. Acta Physica Sinica, 2012, 61(19): 196201. doi: 10.7498/aps.61.196201
    [9] Fan Yong, Bu Wen-Bin, Liu Xiao-Xu, Cheng Wei-Dong, Wu Zhong-Hua, Yin Jing-Hua. Research on interface and fractal characteristics of PI/Al2O3Films by SAXS. Acta Physica Sinica, 2011, 60(5): 056101. doi: 10.7498/aps.60.056101
    [10] Zhan Xiang-Lin, Sun Fang, Zeng Zhou-Mo, Wang Xiao-Yuan, Jin Shi-Jiu. Acoustic field characteristics of ultrasonic linear phased array for an interface condition. Acta Physica Sinica, 2011, 60(9): 094301. doi: 10.7498/aps.60.094301
    [11] Zhang Xian-Gang, Zong Ya-Ping, Wang Ming-Tao, Wu Yan. A physical model to express grain boundaries in grain growth simulation by phase-field method. Acta Physica Sinica, 2011, 60(6): 068201. doi: 10.7498/aps.60.068201
    [12] Medvedeva I, Chen Shun-Sheng, Huang Chang, Wang Rui-Long, Yang Chang-Ping. The electrical transport properties of Ag/Nd0.7Sr0.3MnO3 ceramic interface. Acta Physica Sinica, 2011, 60(3): 037304. doi: 10.7498/aps.60.037304
    [13] You Yin-Tao, Wang Ai-Fen, Sun Xiao-Yu, Li Wen-Bin, Zheng Xiao-Yan. Study on the exciton dissociation at the NPB-Alq3 interface. Acta Physica Sinica, 2010, 59(9): 6527-6531. doi: 10.7498/aps.59.6527
    [14] Wen Cai, Li Fang-Hua, Zou Jin, Chen Hong. High-resolution electron microscopy of misfit dislocations in AlSb/GaAs(001) system. Acta Physica Sinica, 2010, 59(3): 1928-1937. doi: 10.7498/aps.59.1928
    [15] Liu Gui-Li, Yang Zhong-Hua, Fang Ge-Liang. Electronic theory study of interface characteristic of magnesium/carbon nanotube with nickel. Acta Physica Sinica, 2009, 58(5): 3364-3369. doi: 10.7498/aps.58.3364
    [16] Yang Hang-Sheng, Xie Ying-Jun. Controlling the interfacial structure of cubic boron nitride thin film prepared by plasma-enhanced chemical vapor deposition. Acta Physica Sinica, 2007, 56(9): 5400-5407. doi: 10.7498/aps.56.5400
    [17] Liu Gui-Li, Guo Yu-Fu, Li Rong-De. Electronic theory of interface characteristics of ZA27/CNT. Acta Physica Sinica, 2007, 56(7): 4075-4078. doi: 10.7498/aps.56.4075
    [18] Tang Yuan-He, Xie Guang-Yong, Liu Han-Chen, Shao Jian-Bin, Ma Qi, Liu Hui-Ping, Ning Hui, Yang Yu, Yan Cheng-Hai. Study of the interface optical property of bubbles in water based on PIV. Acta Physica Sinica, 2006, 55(5): 2257-2262. doi: 10.7498/aps.55.2257
    [19] Liu Xue-Rong, Hu Bo, Liu Wen-Han, Gao Chen. The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy. Acta Physica Sinica, 2003, 52(1): 34-38. doi: 10.7498/aps.52.34
    [20] MU WEI-BING, CHEN PAN-XUN. MONTE-CARLO CALCULATION OF X-RAY DOSE ENHANCEMENT FACTOR NEARBY HIGH Z METAL CONNECTED INTERFACE. Acta Physica Sinica, 2001, 50(2): 189-192. doi: 10.7498/aps.50.189
Metrics
  • Abstract views:  6357
  • PDF Downloads:  1002
  • Cited By: 0
Publishing process
  • Received Date:  28 August 2012
  • Accepted Date:  13 September 2012
  • Published Online:  05 February 2013

/

返回文章
返回