STUDY ON MICROSTRUCTURAL CHARACTERIZATION AND FERROMAGNETIC RESONANCE IN SPUTTERED Co/V MULTILAYERS
Acta Physica Sinica
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Acta Phys. Sin.  1999, Vol. 48 Issue (1): 171-179    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
STUDY ON MICROSTRUCTURAL CHARACTERIZATION AND FERROMAGNETIC RESONANCE IN SPUTTERED Co/V MULTILAYERS
WU JING1, DU JUN1, LU MU1, ZHAO XIAO-NING1, XU HUI-PING1, ZHAI HONG-RU1, XIA HUI2, ZHANG SHU-YUAN3, ZHANG YU-HENG3
(1)南京大学物理系,现代分析中心,固体微结构物理国家重点实验室,南京 210093; (2)冶金工业部有色金属研究总院,北京 100088; (3)中国科学技术大学结构分析中心,合肥 230026
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