STUDY ON STRESS INDEUCED LEAKAGE CURRENT TRANSIENT CHARACTERISTICS IN THIN GATE OXIDE
Acta Physica Sinica
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Acta Phys. Sin.  2001, Vol. 50 Issue (9): 1769-1773    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
STUDY ON STRESS INDEUCED LEAKAGE CURRENT TRANSIENT CHARACTERISTICS IN THIN GATE OXIDE
LIU HONG-XIA, HAO YUE
西安电子科技大学微电子研究所,西安710071
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