Microstructure induced by stress generated by high-current pulsed electron beam
Acta Physica Sinica
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Acta Phys. Sin.  2005, Vol. 54 Issue (8): 3927-3934    
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Microstructure induced by stress generated by high-current pulsed electron beam
Qin Ying1, Zou Jian-Xin1, Hao Sheng-Zhi1, Zhang Qing-Yu1, Dong Chuang1, Guan Qing-Feng2, An Chun-Xiang2, Zou Guang-Tian2
(1)大连理工大学三束材料改性国家重点实验室,大连 116024; (2)吉林大学材料科学与工程学院,超硬材料国家重点实验室,长春 130025
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