Effect of Ni thickness on the contact properties of Ni/6H-SiC analyzed by combinatorial method
Acta Physica Sinica
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Acta Phys. Sin.  2010, Vol. 59 Issue (5): 3466-3472    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Effect of Ni thickness on the contact properties of Ni/6H-SiC analyzed by combinatorial method
Liu Qing-Feng1, Liu Qian1, Zhang Jing-Yu2, Chen Zhi-Zhan3, Chen Yi3, Shi Er-Wei3, Huang Wei4
(1)中国科学院上海硅酸盐研究所高性能陶瓷和超微结构国家重点实验室,上海 200050; (2)中国科学院上海硅酸盐研究所高性能陶瓷和超微结构国家重点实验室,上海 200050;中国科学院研究生院,北京 100049; (3)中国科学院上海硅酸盐研究所宽禁带半导体材料课题组,上海 200050; (4)中国科学院上海硅酸盐研究所宽禁带半导体材料课题组,上海 200050;中国科学院研究生院,北京 100049
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