Study of structural and electrical properties of phase-change materials Ge<sub>1</sub>Sb<sub>2</sub>Te<sub>4</sub> and Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> thin films
Acta Physica Sinica
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Acta Phys. Sin.  2010, Vol. 59 Issue (9): 6563-6568    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Study of structural and electrical properties of phase-change materials Ge1Sb2Te4 and Ge2Sb2Te5 thin films
Liao Yuan-Bao, Xu Ling, Yang Fei, Liu Wen-Qiang, Liu Dong, Xu Jun, Ma Zhong-Yuan, Chen Kun-Ji
Nanjing National Laboratory of Microstructures, Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, Department of Physics, Nanjing University, Nanjing 210093, China
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