Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process
Acta Physica Sinica
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Acta Phys. Sin.  2011, Vol. 60 Issue (1): 016102    
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Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process
Wu Zhong-Hua1, Sun Guang-Ai2, Chen Bo2, Yan Guan-Yun2, Huang Chao-Qiang2, Liu Yi3, Wang Jie3, Wu Er-Dong4, Li Wu-Hui4
(1)Insitute of High Energy Physics, CAS, Beijings 100049, China; (2)Institute of Nuclear Physics and Chemistry, CAEP, Mianyang 621900, China; (3)Institute of Shanghai Apply Physics, CAS, Shanghai 201800, China; (4)National Laboratory for Materials Science, IMR CAS, Sehnyang 110016, China
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