DC characteristic research based on surface potential for a-Si:H thin-film transistor
Acta Physica Sinica
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Acta Phys. Sin.  2012, Vol. 61 Issue (23): 237104     doi:10.7498/aps.61.237104
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Archive| Adv Search  |   
DC characteristic research based on surface potential for a-Si:H thin-film transistor
Chen Xiao-Xue, Yao Ruo-He
School of Electronic and Information Engineering, South China University of Technology, Guangzhou 510640, China
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