STM study of growth of manganese silicide thin films on a Si(100)-2×1 surface
Acta Physica Sinica
Citation Search Quick Search
Acta Phys. Sin  2012, Vol. 61 Issue (6): 066801     doi:10.7498/aps.61.066801
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Archive| Adv Search  |   
STM study of growth of manganese silicide thin films on a Si(100)-2×1 surface
Li Wei-Cong1,Zou Zhi-Qiang12,Wang Dan1,Shi Gao-Ming12
1. Instrumental Analysis Center, Shanghai Jiaotong University, Shanghai 200240, China;
2. Department of Physics, Shanghai Jiaotong University, Shanghai 200240, China
Copyright © Acta Physica Sinica
Address: Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China
Tel: 010-82649294,82649829,82649863   E-mail: aps8@iphy.ac.cn