The damage effect and mechanism of bipolar transistors induced by injection of electromagnetic pulse from the base
Acta Physica Sinica
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Acta Phys. Sin  2013, Vol. 62 Issue (6): 068501     doi:10.7498/aps.62.068501
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The damage effect and mechanism of bipolar transistors induced by injection of electromagnetic pulse from the base
Ren Xing-Rong, Chai Chang-Chun, Ma Zhen-Yang, Yang Yin-Tang, Qiao Li-Ping, Shi Chun-Lei
School of Microelectronics, Xidian University, Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, Xi’an 710071, China
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