Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testing
Acta Physica Sinica
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Acta Phys. Sin  2013, Vol. 62 Issue (6): 068502     doi:10.7498/aps.62.068502
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Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testing
Guo Chun-Sheng, Wan Ning, Ma Wei-Dong, Zhang Yan-Feng, Xiong Cong, Feng Shi-Wei
College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
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