An optimal layered inhomogeneous background used in microwave tomography system in metallic chamber
Acta Physica Sinica
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Acta Phys. Sin  2014, Vol. 63 Issue (18): 184102     doi:10.7498/aps.63.184102
ELECTROMAGENTISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS Current Issue| Archive| Adv Search  |   
An optimal layered inhomogeneous background used in microwave tomography system in metallic chamber
Ding Liang1 2, Liu Pei-Guo1, He Jian-Guo1, Joe LoVetri2
1. School of Electronic Science and Engineering, National University of Defense Technology, Changsha 410073, China;
2. Department of Electrical and Computer Engineering, University of Manitoba, Winnipeg, MB R3T 5V6, Canada
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