A unified model for 1/f noise in n-channel and p-channel MOSFETs
Acta Physica Sinica
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Acta Phys. Sin.  2005, Vol. 54 Issue (5): 2118-2122    
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A unified model for 1/f noise in n-channel and p-channel MOSFETs
Bao Jun-Lin, Zhuang Yi-Qi, Du Lei, Li Wei-Hua, Wan Chang-Xing, Zhang Ping
宽禁带半导体材料与器件教育部重点实验室,西安电子科技大学微电子研究所,西安 710071
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