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Mechanism of NBTI degradation in ultra deep submicron PMOSFET’s

Li Zhong-He Liu Hong-Xia Hao Yue

Citation:

Mechanism of NBTI degradation in ultra deep submicron PMOSFET’s

Li Zhong-He, Liu Hong-Xia, Hao Yue
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  • Abstract views:  7877
  • PDF Downloads:  2276
  • Cited By: 0
Publishing process
  • Received Date:  20 May 2005
  • Accepted Date:  04 July 2005
  • Published Online:  05 January 2006

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