Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer
Acta Physica Sinica
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Acta Phys. Sin.  2006, Vol. 55 Issue (3): 1055-1060    
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Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer
Liu Yong-Jun1, Hu Li-Fa1, Li Da-Yu1, Cao Zhao-Liang1, Xuan Li1, Mu Quan-Quan2
(1)中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,长春 130033; (2)中国科学院长春光学精密机械与物理研究所应用光学国家重点实验室,长春 130033;中国科学院研究生院,北京 100049
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