A comparison of ionizing radiation damage in CMOS devices from <sup>60</sup>Co Gamma rays, electrons and protons
Acta Physica Sinica
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Acta Phys. Sin.  2006, Vol. 55 Issue (7): 3546-3551    
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
A comparison of ionizing radiation damage in CMOS devices from 60Co Gamma rays, electrons and protons
He Bao-Ping, Chen Wei, Wang Gui-Zhen
西北核技术研究所,西安 710613
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