Comparison of measuring methods of sheet carrier density in AlGaN/GaN heterostructures
Acta Physica Sinica
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Acta Phys. Sin.  2007, Vol. 56 Issue (11): 6629-6633    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Comparison of measuring methods of sheet carrier density in AlGaN/GaN heterostructures
Ni Jin-Yu, Zhang Jin-Cheng, Hao Yue, Yang Yan, Chen Hai-Feng, Gao Zhi-Yuan
西安电子科技大学微电子学院,宽禁带半导体材料与器件教育部重点实验室,西安 710071
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