Temperature measurement with one dimensional defect photonic crystal
Tong Kai1 , Cui Wei-Wei1 , Li Zhi-Quan1 , Wang Mei-Ting2
(1)燕山大学电气工程学院，秦皇岛 066004; (2)燕山大学继续教育学院，秦皇岛 066004
Abstract Si and SiO2 were used as materials to build the one-dimension (1D) defect photonic crystal and the medium of detect layer is Si. Using transfer matrix method, the optical transmission properties in 1D defect photonic crystals was analyzed, and the band gap property of 1D photonic crystal was obtained. Because of the defect, the defect peak appears in the transmission spectra. According to thermo-optical effect and thermal-expansion effect the optical depth and index of the materials and the defect of photonic crystal vary when the temperature changes. So the temperature can be measured by the wavelength shift value of the defect peak. Using 1D defect photonic crystal an experimentation system was set up for temperature measurement. The result showed that there is a linear relationship between the temperature of photonic crystal and the wave-length of the peak. And the sensitivity of this measuring system is 0207nm/℃ and the measurement range is -20—120℃.
Key words ：
temperature measurement
one dimensional photonic crystal
transfer matrix method
defect peak
Received: 2007-03-28
Published: 2008-02-20
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2008, Vol. 57 
