A fast algorithm for reflectivity calculation of micro/nano deep trench structures by corrected effective medium approximation
Acta Physica Sinica
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Acta Phys. Sin.  2008, Vol. 57 Issue (9): 5996-6001    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
A fast algorithm for reflectivity calculation of micro/nano deep trench structures by corrected effective medium approximation
Liu Shi-Yuan1, Zhang Chuan-Wei1, Gu Hua-Yong2, Shen Hong-Wei2
(1)华中科技大学数字制造装备与技术国家重点实验室,武汉 430074; (2)武汉光电国家实验室光电材料与微纳制造研究部,武汉 430074
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