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Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopy

Liu Xue-Qin Han Guo-Jian Huang Chun-Kui Lan Wei

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Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopy

Liu Xue-Qin, Han Guo-Jian, Huang Chun-Kui, Lan Wei
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  • Abstract views:  5933
  • PDF Downloads:  1490
  • Cited By: 0
Publishing process
  • Received Date:  08 January 2009
  • Accepted Date:  27 March 2009
  • Published Online:  20 November 2009

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