Pore structure determination of mesoporous SiO<sub>2</sub> thin films by slow positron annihilation spectroscopy
Acta Physica Sinica
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Acta Phys. Sin.  2009, Vol. 58 Issue (12): 8478-8483    
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Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy
Wang Qiao-Zhan1, Li Yu-Xiao1, Yu Run-Sheng2, Qin Xiu-Bo2, Wang Bao-Yi2, Jia Quan-Jie2
(1)郑州大学物理工程学院,郑州 450001; (2)中国科学院高能物理研究所核分析技术重点实验室,北京 100049
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