Effect of applied stress on exchange bias in ferromagnetic/antiferromagnetic bilayers and the phenomenon of the jump
Acta Physica Sinica
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Acta Phys. Sin.  2009, Vol. 58 Issue (7): 4962-4969    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Effect of applied stress on exchange bias in ferromagnetic/antiferromagnetic bilayers and the phenomenon of the jump
Bai Yu-Hao1, Yun Guo-Hong2, B.Narsu3
(1)内蒙古大学物理科学与技术学院,呼和浩特 010021; (2)内蒙古大学物理科学与技术学院,呼和浩特 010021;内蒙古师范大学物理与电子信息学院,内蒙古自治区功能材料物理与化学重点实验室,呼和浩特 010022; (3)内蒙古师范大学物理与电子信息学院,内蒙古自治区功能材料物理与化学重点实验室,呼和浩特 010022
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