High-resolution electron microscopy of misfit dislocations in AlSb/GaAs(001) system
Acta Physica Sinica
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Acta Phys. Sin.  2010, Vol. 59 Issue (3): 1928-1937    
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
High-resolution electron microscopy of misfit dislocations in AlSb/GaAs(001) system
Zou Jin1, Wen Cai2, Li Fang-Hua2, Chen Hong2
(1)Centre for Microscopy and Microanalysis and Materials Engineering,The University of Queensland,St. Lucia Queensland 4072,Australia; (2)中国科学院物理研究所北京凝聚态物理国家实验室,北京 100190
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