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Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach

Zhou Yi Wu Guo-Song Dai Wei Li Hong-Bo Wang Ai-Ying

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Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach

Zhou Yi, Wu Guo-Song, Dai Wei, Li Hong-Bo, Wang Ai-Ying
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  • Abstract views:  8199
  • PDF Downloads:  2416
  • Cited By: 0
Publishing process
  • Received Date:  18 June 2009
  • Accepted Date:  28 July 2009
  • Published Online:  05 February 2010

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