Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor
Acta Physica Sinica
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Acta Phys. Sin.  2011, Vol. 60 Issue (11): 114210     doi:10.7498/aps.60.114210
ELECTROMAGENTISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS Current Issue| Archive| Adv Search  |   
Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor
Bi Juan1, Zhang Xi-He1, Ni Xiao-Wu2
1. School of Science, Changchun University of Science and Technology, Changchun 130022, China;
2. School of Science, Nanjing University of Science and Technology, Nanjing 210094, China
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