Analysis of Y<sub>2</sub>O<sub>3</sub> doped TiO<sub>2</sub> films topography prepared by radio frequency magnetron sputtering
Acta Physica Sinica
Citation Search Quick Search
Acta Phys. Sin.  2011, Vol. 60 Issue (3): 037702    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
Analysis of Y2O3 doped TiO2 films topography prepared by radio frequency magnetron sputtering
Cao Yue-Hua, Di Guo-Qing
Jiangsu Key Laboratory of Thin Films, Department of Physics, Soochow University, Suzhou 215006 China
Copyright © Acta Physica Sinica
Address: Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China
Tel: 010-82649294,82649829,82649863   E-mail: aps8@iphy.ac.cn