Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase
Acta Physica Sinica
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Acta Phys. Sin.  2011, Vol. 60 Issue (8): 086101     doi:10.7498/aps.60.086101
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Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase
Xu Xiao-Ming, Miao Wei, Tao Kun
Center for Testing and Analyzing of Materials, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
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