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Influence of interface traps of p-type metal-oxide-semiconductor field effect transistor on single event charge sharing collection

Chen Jian-Jun Chen Shu-Ming Liang Bin Liu Bi-Wei Chi Ya-Qing Qin Jun-Rui He Yi-Bai

Citation:

Influence of interface traps of p-type metal-oxide-semiconductor field effect transistor on single event charge sharing collection

Chen Jian-Jun, Chen Shu-Ming, Liang Bin, Liu Bi-Wei, Chi Ya-Qing, Qin Jun-Rui, He Yi-Bai
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  • Abstract views:  5173
  • PDF Downloads:  594
  • Cited By: 0
Publishing process
  • Received Date:  03 September 2010
  • Accepted Date:  29 March 2011
  • Published Online:  05 April 2011

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