THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY

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THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY

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MAI ZHEN-HONG, GE PEI-WEN, CUI SHU-FAN, WU LAN-SHENG

Acta Phys. Sin., 1981, 30(8): 1106-1110.

Abstract
The grown-in defects in a synthetic quartz crystal grown from a 2-cut seed plate have been surveyed by X-ray topography and ion probe method. Besides usual dislocations, it has also been found some rare fault surfaces which have not been reported so far. The configuration, fault vector and formation of the fault surfaces are discussed.
Authors and contacts
MAI ZHEN-HONG,

GE PEI-WEN,

CUI SHU-FAN,

WU LAN-SHENG

1.
中国科学院物理研究所
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