Abstract Direct Fourier-transform analysis method for energy-dependent photoelectron-dif-fraction curves of Se-Ni(001) and S-Ni(001) systems has been studied. The effect of different energy range in which Fourier-transformation was performed on △a (layer-spacing modification) was considered. The possibility that surface structure could be determined by using these △a value and FT of experimental EDPD data has been discussed.
TANG JING-CHANG,HUANG YI. STUDIES OF FOURIER-TRANSFORM ANALYSIS METHOD FOR ENERGY-DEPENDENT PHOTOELEC-TRON-DIFFRACTION (Ⅰ)——THE SYSTEMS OF Se-Ni(001) AND S-Ni(001). Acta Phys. Sin., 1985, 34(4): 464-475.