STUDIES AND ANALYSIS FOR MICROSTRUCTURES OF MICRO-CRYSTALLIZATION PROCESS OF AMORPHOUS SILICON FILMS
Acta Physica Sinica
Citation Search Quick Search
Acta Phys. Sin.  1990, Vol. 39 Issue (11): 1796-1802    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
STUDIES AND ANALYSIS FOR MICROSTRUCTURES OF MICRO-CRYSTALLIZATION PROCESS OF AMORPHOUS SILICON FILMS
CHENG GUANG-XU1, YU SHI-DONG1, HE YU-LIANG2, ZHOU HENG-NAN2, LIU XIANG-NA2
(1)南京大学固体微结构物理实验室,南京,210008; (2)南京大学物理系,南京,210008
Copyright © Acta Physica Sinica
Address: Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China
Tel: 010-82649294,82649829,82649863   E-mail: aps8@iphy.ac.cn