SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF Ge<sub>x</sub>Si<sub>1-x</sub>/Si SUPERLATTICE
Acta Physica Sinica
Citation Search Quick Search
Acta Phys. Sin.  1991, Vol. 40 Issue (1): 56-63    
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICE
ZHOU GUO-LIANG1, SHENG CHI1, JIANG WEI-DONG1, YU MING-REN1, SHEN XIAO-LIANG2
(1)复旦大学表面物理实验室,上海,200433; (2)复旦大学分析测试中心
Copyright © Acta Physica Sinica
Address: Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China
Tel: 010-82649294,82649829,82649863   E-mail: aps8@iphy.ac.cn