X-RAY DOUBLE-CRYSTAL DIFFRACTION STUDY OF HIGH QUALITY Ge<sub>x</sub>Si<sub>1-x</sub>/Si STRAINED LAYER SUPERLATTICE
Acta Physica Sinica
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Acta Phys. Sin.  1991, Vol. 40 Issue (3): 441-448    
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
X-RAY DOUBLE-CRYSTAL DIFFRACTION STUDY OF HIGH QUALITY GexSi1-x/Si STRAINED LAYER SUPERLATTICE
ZHOU GUO-LIANG1, TIAN LIANG-GUANG2, ZHU NAN-CHANG2, CHEN JING-YI2, LI RUN-SHEN2, XU SHUN-SHENG2
(1)复旦大学表面物理实验室,上海,200433; (2)中国科学院上海冶金研究所,上海,200050
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