Spectroscopic ellipsometry study of the Ag<sub>2</sub>O film deposited by radio-frequency reactive magnetron sputtering
Acta Physica Sinica
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Acta Phys. Sin  2012, Vol. 61 Issue (5): 056106     doi:10.7498/aps.61.056106
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Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputtering
Ma Jiao-Min1, Liang Yan2, Gao Xiao-Yong1, Chen Chao1, Zhao Meng-Ke1, Lu Jing-Xiao1
1. Key Laboratory of Materials Physics of Ministry of Education, School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China;
2. College of Information Science and Engineering, Henan University of Technology, Zhengzhou 450001, China
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