A radiation degradation model of metal-oxide-semiconductor field effect transistor
Acta Physica Sinica
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Acta Phys. Sin  2012, Vol. 61 Issue (10): 107803     doi:10.7498/aps.61.107803
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Archive| Adv Search  |   
A radiation degradation model of metal-oxide-semiconductor field effect transistor
Sun Peng, Du Lei, Chen Wen-Hao, He Liang, Zhang Xiao-Fang
School of Technical Physics, Xidian University, Xi'an 710071, China
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