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The characterization of hydrogenated amorphous silicon and epitaxial silicon thin films grown on crystalline silicon substrates by using spectroscopic ellipsometry

Wu Chen-Yang Gu Jin-Hua Feng Ya-Yang Xue Yuan Lu Jing-Xiao

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The characterization of hydrogenated amorphous silicon and epitaxial silicon thin films grown on crystalline silicon substrates by using spectroscopic ellipsometry

Wu Chen-Yang, Gu Jin-Hua, Feng Ya-Yang, Xue Yuan, Lu Jing-Xiao
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  • Abstract views:  6146
  • PDF Downloads:  530
  • Cited By: 0
Publishing process
  • Received Date:  13 November 2011
  • Accepted Date:  15 January 2012
  • Published Online:  05 August 2012

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