Radiation degradation mechanism of pn-junction diode based on 1/<em>f</em> noise variation
Acta Physica Sinica
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Acta Phys. Sin  2012, Vol. 61 Issue (12): 127808     doi:10.7498/aps.61.127808
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Archive| Adv Search  |   
Radiation degradation mechanism of pn-junction diode based on 1/f noise variation
Sun Peng, Du Lei, He Liang, Chen Wen-Hao, Liu Yu-Dong, Zhao Ying
School of Technical Physics, Xidian University, Xi’an 710071, China
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