The effect of electrostatic discharge on the <em>I-V </em>and low frequency noise characterization of Schottky barrier diodes
Acta Physica Sinica
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Acta Phys. Sin  2012, Vol. 61 Issue (13): 137203     doi:10.7498/aps.61.137203
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Archive| Adv Search  |   
The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodes
Liu Yu-Dong, Du Lei, Sun Peng, Chen Wen-Hao
School of Technology Physics, Xi dian University, Xi'an 710071, China
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