Fabrication and characterization of single Nb/Nb<sub><em>x</em></sub>Si<sub>1-<em>x</em></sub>/Nb Josephson junction for voltage standard
Acta Physica Sinica
Citation Search Quick Search
Acta Phys. Sin  2012, Vol. 61 Issue (17): 170304     doi:10.7498/aps.61.170304
GENERAL Current Issue| Archive| Adv Search  |   
Fabrication and characterization of single Nb/NbxSi1-x/Nb Josephson junction for voltage standard
Cao Wen-Hui1, Li Jin-Jin1, Zhong Qing1, Guo Xiao-Wei2, He Qing1, Chi Zong-Tao2
1. National Institute of Metrology, Beijing 100013, China;
2. Qingdao University, Qingdao 266003, China
Copyright © Acta Physica Sinica
Address: Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China
Tel: 010-82649294,82649829,82649863   E-mail: aps8@iphy.ac.cn