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Effects of low-temperature annealing phosphorous gettering process on the electrical properties of multi-crystalline silicon with a low minority carrier lifetime

Jiang Li-Li Lu Zhong-Lin Zhang Feng-Ming Lu Xiong

Citation:

Effects of low-temperature annealing phosphorous gettering process on the electrical properties of multi-crystalline silicon with a low minority carrier lifetime

Jiang Li-Li, Lu Zhong-Lin, Zhang Feng-Ming, Lu Xiong
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  • Abstract views:  5400
  • PDF Downloads:  1553
  • Cited By: 0
Publishing process
  • Received Date:  08 September 2012
  • Accepted Date:  10 December 2012
  • Published Online:  05 June 2013

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