The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers
Acta Physica Sinica
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Acta Phys. Sin  2013, Vol. 62 Issue (11): 110702     doi:10.7498/aps.62.110702
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The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers
Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng
State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing 100083, China
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