Effect of thickness on the properties of Cu(In<sub><i>x</i></sub>,Ga<sub>1-<i>x</i></sub>)Se<sub>2</sub> back conduct Mo thin films prepared by DC sputtering
Acta Physica Sinica
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Acta Phys. Sin  2013, Vol. 62 Issue (11): 116801     doi:10.7498/aps.62.116801
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Archive| Adv Search  |   
Effect of thickness on the properties of Cu(Inx,Ga1-x)Se2 back conduct Mo thin films prepared by DC sputtering
Tian Jing, Yang Xing, Liu Shang-Jun, Lian Xiao-Juan, Chen Jin-Wei, Wang Rui-Lin
College of materials science and engineering, Sichuan University, Chendu 610065, China
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