Electrical, optical properties and structure characterization of In-doped copper nitride thin film
Acta Physica Sinica
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Acta Phys. Sin  2013, Vol. 62 Issue (11): 118104     doi:10.7498/aps.62.118104
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Electrical, optical properties and structure characterization of In-doped copper nitride thin film
Du Yun1 2, Lu Nian-Peng2, Yang Hu3, Ye Man-Ping4, Li Chao-Rong3
1. Information Engineering School, Hangzhou Dianzi University, Hangzhou 310018, China;
2. State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
3. School of Sciences, Zhejiang Sec-Tech of University, Hangzhou 310018, China;
4. College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, China
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