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An optimization method for ion etching yield modeling combined with factual etching data

Gao Yang-Fu Sun Xiao-Min Song Yi-Xu Ruan Cong

Citation:

An optimization method for ion etching yield modeling combined with factual etching data

Gao Yang-Fu, Sun Xiao-Min, Song Yi-Xu, Ruan Cong
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(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

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  • Abstract views:  4389
  • PDF Downloads:  204
  • Cited By: 0
Publishing process
  • Received Date:  19 May 2014
  • Accepted Date:  10 August 2014
  • Published Online:  05 December 2014

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