PHOTOLUMINESCENCE STUDY FOR NANOMETER Ge PARTICLES EMBEDDED Si OXIDE FILMS
Acta Physica Sinica
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Acta Phys. Sin.  1998, Vol. 47 Issue (3): 502-507    
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search  |   
PHOTOLUMINESCENCE STUDY FOR NANOMETER Ge PARTICLES EMBEDDED Si OXIDE FILMS
MA SHU-YI1, ZHANG BUO-RUI1, QIN GUO-GANG1, MA ZHEN-CHANG2, ZONG WAN-HUA2, HAN HE-XIANG3, WANG ZHAO-PING3, LI GUO-HUA3
(1)北京大学物理系,北京 100871; (2)电子工业部第十三研究所,石家庄 050051; (3)中国科学院半导体研究所,半导体超晶格国家重点实验室,北京 100083
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