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Chipless radio frequency identification tags have been widely used in many areas, such as vehicle recognition and identification of goods. Near-field measurement of a chipless radio frequency identification tag is important for offering the precise spatial information of the backscattered field of tag. In this paper, we demonstrate the angle discrimination of a line-shape chipless radio-frequency identification tag via the near-field measurements of scattered electric fields in two orthogonal directions. Two laser beams with different frequencies counter propagate and pass through a roomtemperature caesium vapor. A Rydberg ladder-type system is formed in the experiment, which includes three levels, namely 6S1/2, 6P3/2, 51D5/2. The electromagnetically induced transparency of transmission of probe light, which is locked to the transition of 6S1/2↔ 6P3/2, is observed when the frequency of coupling light varies nearby the transition of 6P3/2↔ 51D5/2. When the 5.366 GHz microwave electric field that is resonant with the transition between two adjacent Rydberg states 51D5/2↔ 52P3/2 is applied to the caesium vapor cell by using a standard-gain horn antenna, the transmission signal of probe laser splits into two peaks, which is known as Autler-Townes splitting. The splitting between the transmission peaks is proportional to the microwave electric field strength at the position of laser beam. The spatial distribution of backscattered microwave electric field of the chipless radio-frequency identification tag is obtained through varying the position of the laser beam. The spatial resolution of near-field measurement approximately equals λMW/12, where λMW is the wavelength of the measured microwave electric field. The distributions of the electric field strength in two orthogonal directions show the clarity difference while the angle of radio-frequency identification tag is changed. The scattered electric field strength of the identification tag is strongest when the angle of line-shape tag is the same as that of the polarization of the horn antenna. Moreover, the scattered field strength of identification tag in the incident field direction of the horn antenna increases as the measured position and the identification tag get closer to each other. The scattered electric field distributions in the vertical direction are almost constant at the different angles between the incident electric filed and identification tag. The fluctuation of spatial distribution of the scattered electric field strength is attributed to the Fabry-Pérot effect of microwave electric field in the vapor cell. And the geometry of vapor cell results in the minor asymmetric distribution of scattered field. The simulation results from the electromagnetic simulation software are accordant with the experimental results. The novel approach to near-field measurement of identification tag will contribute to studying and designing the chipless radio-frequency identification tag and complex circuits.
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Keywords:
- electromagnetically induced transparency /
- Rydberg atom /
- chipless radio frequency identification tag /
- backscattered electric field
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[2] Yan L Y, Zhang W M 2016 J. Test Measur. Technol. 30 62 (in Chinese) [闫丽云, 张文梅 2016 测试技术学报 30 62]
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[5] Kominis I K, Kornack T W, Allred J C, Romalis M V 2003 Nature 422 596
[6] Savukov I M, Seltzer S J, Romalis M V, Sauer K L 2005 Phys. Rev. Lett. 95 063004
[7] Gallagher T F 1994 Rydberg Atoms (Cambridge: Cambridge University Press) p11
[8] Sedlacek J A, Schwettmann A, Kbler H, Löw R, Pfau T, Shaffer J P 2012 Nat. Phys. 8 819
[9] Kumar S, Fan H Q, Kbler H, Jahangiri A J, Shaffer J P 2017 Opt. Express 25 8625
[10] Gordon J A, Holloway C L, Schwarzkopf A, Anderson D A, Miller S, Thaicharoen N, Raithel G 2014 Appl. Phys. Lett. 105 024104
[11] Fan H Q, Kumar S, Daschner R, Kbler H, Shaffer J P 2014 Opt. Lett. 39 3030
[12] Fan H, Kumar S, Sheng J, Shaffer J P, Holloway C L, Gordon J 2015 Phys. Rev. Appl. 4 044015
[13] Li J K, Yang W G, Song Z F, Zhang H, Zhang L J, Zhao J M, Jia S T 2015 Acta Phys. Sin. 64 163201 (in Chinese) [李敬奎, 杨文广, 宋振飞, 张好, 张临杰, 赵建明, 贾锁堂 2015 物理学报 64 163201]
[14] Anderson D A, Miller S A, Raithel G 2016 Phys. Rev. Appl. 5 034003
[15] Horsley A, Du G X, Treutlein P 2015 New J. Phys. 17 112002
[16] Bohi P, Treutlein P 2012 Appl. Phys. Lett. 101 181107
[17] Holloway C L, Gordon J A, Schwarzkopf A, Anderson D A, Miller S A, Thaicharoen N, Raithel G 2014 Appl. Phys. Lett. 104 244102
[18] Zhou J, Zhang W Q, Hao Y M, Jin T, Jiang X H, Zhang H, Zhang L J 2016 J. Quantum Opt. 22 311 (in Chinese) [周健, 张玮茜, 郝艳梅, 金桐, 蒋徐浩, 张好, 张临杰 2016 量子光学学报 22 311]
[19] Liu J S, Zhang H, Song Z F, Zhang L J, Jia S T 2016 IEEE MTT-S International Conference Beijing, China, July 27-29, 2016 p1
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[1] Vena A, Perret E, Tedjini S 2011 IEEE Trans. Microw. Theory Tech. 59 3356
[2] Yan L Y, Zhang W M 2016 J. Test Measur. Technol. 30 62 (in Chinese) [闫丽云, 张文梅 2016 测试技术学报 30 62]
[3] Cown B J, Ryan C J 1989 IEEE Trans. Antennas Propag. 37 576
[4] Wu Y, Xue Z, Ren W, Li W M, Xu X W 2012 6th Asia-Pacific Conference on Environmental Electromagnetics (CEEM) Shanghai, China, November 6-9, 2012 p72
[5] Kominis I K, Kornack T W, Allred J C, Romalis M V 2003 Nature 422 596
[6] Savukov I M, Seltzer S J, Romalis M V, Sauer K L 2005 Phys. Rev. Lett. 95 063004
[7] Gallagher T F 1994 Rydberg Atoms (Cambridge: Cambridge University Press) p11
[8] Sedlacek J A, Schwettmann A, Kbler H, Löw R, Pfau T, Shaffer J P 2012 Nat. Phys. 8 819
[9] Kumar S, Fan H Q, Kbler H, Jahangiri A J, Shaffer J P 2017 Opt. Express 25 8625
[10] Gordon J A, Holloway C L, Schwarzkopf A, Anderson D A, Miller S, Thaicharoen N, Raithel G 2014 Appl. Phys. Lett. 105 024104
[11] Fan H Q, Kumar S, Daschner R, Kbler H, Shaffer J P 2014 Opt. Lett. 39 3030
[12] Fan H, Kumar S, Sheng J, Shaffer J P, Holloway C L, Gordon J 2015 Phys. Rev. Appl. 4 044015
[13] Li J K, Yang W G, Song Z F, Zhang H, Zhang L J, Zhao J M, Jia S T 2015 Acta Phys. Sin. 64 163201 (in Chinese) [李敬奎, 杨文广, 宋振飞, 张好, 张临杰, 赵建明, 贾锁堂 2015 物理学报 64 163201]
[14] Anderson D A, Miller S A, Raithel G 2016 Phys. Rev. Appl. 5 034003
[15] Horsley A, Du G X, Treutlein P 2015 New J. Phys. 17 112002
[16] Bohi P, Treutlein P 2012 Appl. Phys. Lett. 101 181107
[17] Holloway C L, Gordon J A, Schwarzkopf A, Anderson D A, Miller S A, Thaicharoen N, Raithel G 2014 Appl. Phys. Lett. 104 244102
[18] Zhou J, Zhang W Q, Hao Y M, Jin T, Jiang X H, Zhang H, Zhang L J 2016 J. Quantum Opt. 22 311 (in Chinese) [周健, 张玮茜, 郝艳梅, 金桐, 蒋徐浩, 张好, 张临杰 2016 量子光学学报 22 311]
[19] Liu J S, Zhang H, Song Z F, Zhang L J, Jia S T 2016 IEEE MTT-S International Conference Beijing, China, July 27-29, 2016 p1
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