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Acta Physica Sinica  2018, Vol. 67 Issue (14): .     DOI: 10.7498/aps.67.20172542
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Radiation effect and degradation mechanism in 65 nm CMOS transistor
Ma Wu-Ying1,2, Yao Zhi-Bin1,2, He Bao-Ping1,2, Wang Zu-Jun1,2, Liu Min-Bo1,2, Liu Jing2, Sheng Jiang-Kun1,2, Dong Guan-Tao1,2, Xue Yuan-Yuan1,2
1. State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Xi'an 710024, China;
2. Northwest Institute of Nuclear Technology, Xi'an 710024, China

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