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The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy

Liu Xue-Rong Hu Bo Liu Wen-Han Gao Chen

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The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy

Liu Xue-Rong, Hu Bo, Liu Wen-Han, Gao Chen
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  • Abstract views:  6849
  • PDF Downloads:  583
  • Cited By: 0
Publishing process
  • Received Date:  31 March 2002
  • Accepted Date:  11 June 2002
  • Published Online:  03 April 2005

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